Odysseus Software has just released version 2.0 Public Beta of STAN, the leading Eclipse-based structure analysis tool for Java.
STAN uniquely combines visual dependency analysis with metric-based quality monitoring. Its innovative features, ease of use and intuitiveness make STAN unique to the market of software quality tools. The white paper gives a brief introduction to structure analysis with STAN.
STAN 2.0 Public Beta can be downloaded and used without installing a license key.
- Explore dependencies between any artifacts as simple as Drag'n Drop
The Sandbox view allows to investigate code dependencies between any classes, packages, package trees or libraries. Artifacts can be easily added using Drag'n Drop from the Structure Explorer. Play around using split, expand/collapse and remove operations.
- Visualize metric ratings in fancy green-to-red treemaps
Treemaps are a great tool for space efficient visualization of hierarchical structures. The Map view is used to visualize metric ratings. (E.g. show the ratings for cyclomatic complexity of all methods as a treemap).
- Eclipse Project dependencies Reloaded
The Project Dependencies view is used to show dependencies between Eclipse projects in a graph. Again nodes can be added via Drag'n Drop. Graphs can be manipulated by adding missing incoming or outgoing dependencies.
- And for the Plug-in developer...
the Bundle Dependencies view does the same for Plug-in projects and OSGi bundles from the active target platform.
The beta period will last until February 28 of 2010. During this period, you are invited to download and use the fully functional product for evaluation purposes. Moreover, STAN 2.0 will have a community license
option for free, non-commercial use.
Please visit http://stan4j.com for further information.